We describe a plane-wave-expansion approach for calculation of the fringe pattern in transmission and reflection for a Gaussian monochromatic beam. Both positive and negative incidence, at which the incident light beam undergoes multiple reflections within the wedge in direction of increasing or decreasing wedge thickness respectively, are analyzed. It is shown that the two opposite incidences of the light beam are described by the same mathematical expressions; i.e., the transmitted/reflected fringe pattern at positive incidence is a continuation of the pattern at negative incidence at some distance from the wedge. Numerical simulations are made for a high-reflectivity-coating air-gap Fizeau interferential wedge with apex angle of 5-100 microrad and thickness of 5-500 microm as a useful optical element in laser resonator design. Experimental verification is also provided.
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http://dx.doi.org/10.1364/JOSAA.27.000058 | DOI Listing |
J Opt Soc Am A Opt Image Sci Vis
January 2010
Central Laboratory of Optical Storage and Processing of Information, Bulgarian Academy of Sciences, Acad. G. Bonchev Str., Bl. 101, 1113 Sofia, Bulgaria.
We describe a plane-wave-expansion approach for calculation of the fringe pattern in transmission and reflection for a Gaussian monochromatic beam. Both positive and negative incidence, at which the incident light beam undergoes multiple reflections within the wedge in direction of increasing or decreasing wedge thickness respectively, are analyzed. It is shown that the two opposite incidences of the light beam are described by the same mathematical expressions; i.
View Article and Find Full Text PDFAppl Opt
July 2003
National Institute of Industrial Science and Technology, 1-2 Namiki, Tsukuba, 305-8564 Japan.
Testing for flatness of an optical parallel plate in a Fizeau interferometer suffers from problems caused by multiple-beam interference noise. Each internal-reflection component can be separated from the signal by its modulation frequency in a wavelength-scanned interferometer; however, the frequency depends on the thickness and the refractive-index dispersion of the test plate and on the nonlinearity of the scanning source. With a new 19-sample wavelength-scanning algorithm we demonstrate the elimination of the reflection noise, the effect of the dispersion up to the second order of the reflectance of the test plate, and as the nonlinearity of the source.
View Article and Find Full Text PDFA white-light Fizeau interferometer is described. Commonly, white-light fringes can be produced only by using a virtual wedge instrument such as a Michelson interferometer. By use of a series arrangement of a Fabry-Perot interferometer in front of a two-beam Fizeau interferometer, white-light fringes can be produced.
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