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Statistical-based detection of pilot contamination attack for NOMA in 5G networks.

Sci Rep

January 2025

Department of Information Technology, Faculty of Computers and Information, Assiut University, Assiut, Assiut, 71515, Egypt.

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The testing and modeling of semiconductor devices are the foundation of circuit design. The issue of high-power device testing urgently needs to be solved as the power level of the devices under test (DUTs) increases. This work proposes advanced measurement methods based on three aspects of "measuring capability, security, and stability" with a focus on the features of high output power, easy self-oscillation in mismatch tests, and safety risk in the measurement system of high-power transistors.

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