Analysis of multiple reflection effects in reflective measurements of electro-optic coefficients of poled polymers in multilayer structures.

We present new closed-form expressions for analysis of Teng-Man measurements of the electro-optic coefficients of poled polymer thin films. These expressions account for multiple reflection effects using a rigorous analysis of the multilayered structure for varying angles of incidence. The analysis based on plane waves is applicable to both transparent and absorptive films and takes into account the properties of the transparent conducting electrode layer. Methods for fitting data are presented and the error introduced by ignoring the transparent conducting layer and multiple reflections is discussed.