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Article Abstract

The super-resolution of the nonlinear multilayer structure is analyzed, and the results indicate that the super-resolution stems from the internal multi-interference. For the nonlinear Si-based thin film, the reflected spot size can be reduced to 0.5 times that of the original spot, and the super-resolution pit arrays on the discs are dynamically read out experimentally.

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http://dx.doi.org/10.1166/jnn.2009.c068DOI Listing

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