Contrast-transfer calculations indicate that C(c) correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. Our first C(c)-corrected energy-filtered experiments examining a (LaAlO(3))(0.3)(Sr(2)AlTaO(6))(0.7)/LaCoO(3) interface demonstrated a significant gain for the spatial resolution in elemental maps of La.
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http://dx.doi.org/10.1093/jmicro/dfp021 | DOI Listing |
Ultramicroscopy
October 2022
Materials Science Center and Faculty of Physics, Philipps-Universität Marburg, Hans-Meerweinstraße 6, Marburg, Germany. Electronic address:
High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) is a valuable method for composition determination of nanomaterials. However, light elements do not scatter efficiently into the scattering angles employed for HAADF-STEM which hinders the composition determination of material systems containing light elements by HAADF-STEM. This makes the usage of lower scattering angles favourable.
View Article and Find Full Text PDFData Brief
April 2021
Vrije Universiteit Brussel (VUB), Research Group of Electrochemical and Surface Engineering, Pleinlaan 2, B-1050 Brussels, Belgium.
The data presented in this article are related to the measurements in the contribution titled: 'Tarnished silver-copper surfaces reduction using remote helium plasma at atmospheric pressure studied by means of high-resolution synchrotron x-ray photoelectron microscopy' published in Corrosion Science. X-ray photoelectron spectra were collected from pure silver, sterling silver (92.5 w% Ag and 7.
View Article and Find Full Text PDFUltramicroscopy
December 2020
Materialwissenschaftliche Elektronenmikroskopie, Universität Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany. Electronic address:
The realization of chromatic aberration correction enables energy-filtered transmission electron microscopy (EFTEM) at atomic resolution even for large energy windows. Previous works have demonstrated lattice contrast from ionization-edge signals such as the L edges of silicon or titanium. However, the direct interpretation as chemical information was found to be hampered by contributions from elastic contrast with dynamic scattering, especially for thick samples.
View Article and Find Full Text PDFNanomaterials (Basel)
January 2020
'Nanostructuring, Nanoanalysis and Photonic Materials' Group, Department of Physics, Paderborn University, 33098 Paderborn, Germany.
Block copolymer (BCP) self-assembly is a promising tool for next generation lithography as microphase separated polymer domains in thin films can act as templates for surface nanopatterning with sub-20 nm features. The replicated patterns can, however, only be as precise as their templates. Thus, the investigation of the morphology of polymer domains is of great importance.
View Article and Find Full Text PDFUltramicroscopy
August 2019
Department of Mining and Materials Engineering, McGill University, Montréal, Québec H3A 0C5, Canada. Electronic address:
A commercial electron energy-loss spectrometer (EELS) attached to a high-resolution cold-field emission scanning electron microscope in transmission mode (STEM) is evaluated and its potential for characterizing materials science thin specimens at low accelerating voltage is reviewed. Despite the increased beam radiation damage at SEM voltages on sensitive compounds, we describe some potential applications which benefit from lowering the primary electrons voltage on less-sensitive specimens. We report bandgap measurements on several dielectrics which were facilitated by the lack of Cherenkov radiation losses at 30 kV.
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