AI Article Synopsis
- The shear-force constant-distance scanning electrochemical microscope uses a phase-controlled feedback system to maintain the distance between the tip and the substrate.
- This method is more sensitive than traditional amplitude-controlled systems, allowing for finer adjustments in distance.
- The enhanced phase control offers quicker reactions to changes in frequency, leading to better sensitivity in measurements taken during the constant-distance mode.
Article Abstract
The present shear-force constant-distance scanning electrochemical microscope regulates tip-to-substrate distance using a phase-controlled feedback mechanism that is more sensitive than the amplitude-controlled constant-distance scanning electrochemical microscopes. Phase control responds faster to frequency perturbation and presents enhance sensitivity during distance curves under constant-distance mode.
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| http://dx.doi.org/10.1021/ac802211u | DOI Listing |
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