High-resolution microspectrometer with an aberration-correcting planar grating.

Appl Opt

Faculty Electrical Engineering, Mathematics and Computer Science, Department of MicroElectronics/Electronic Instrumentation, Delft University of Technology, Mekelweg 4, 2628 CD,Delft, The Netherlands.

Published: December 2008

A concept for a highly miniaturized spectrometer featuring a two-component design is presented. The first component is a planar chip that integrates an input slit and aberration-correcting diffraction grating with an image sensor and is fabricated using microelectromechanical systems (MEMS) technologies. Due to the fabrication in a simple MEMS batch process the essential elements of the spectrometer are automatically aligned, and a low fabrication cost per device can be achieved. The second component is a spherical mirror, which is the only external part. The optimized grating structure compensates for aberrations within the spectrometer operating range, resulting in a diffraction-limited performance of the spectrometer optics. The prototype of the device has been fabricated and characterized. It takes a volume of 0.5 cm(3) and provides a FWHM spectral resolution of 0.7 nm over a 350 nm bandwidth from 420 nm to 770 nm combined with an etendue of 7.4x10(-5) mm(2) sr.

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Source
http://dx.doi.org/10.1364/ao.47.006442DOI Listing

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