Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1034
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3152
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Human provocation studies that investigate the effects of Global System for Mobiles (GSM) communication systems on the brain have focused on Radio Frequency (RF) exposure. We wish to further extend such study by investigating the effect of both RF and Extremely Low Frequency (ELF) field exposure, the latter generated by the GSM handset's battery switching. The use of a commercial handset as an exposure source for such investigations is problematic for a number of reasons and therefore a simulated exposure source, capable of producing both RF and ELF components of exposure, is desirable. As a first step in developing such a source, we have quantified and characterized the ELF field from several commercial handsets (the RF characteristics being already well understood). Through experimental measurement we deduce that these fields can be sufficiently simulated by a 9 mm radius loop residing 10 mm beneath the front surface of the handset device and carrying enough current to generate peak fields of 25 microT at the surface of the handset.
Download full-text PDF |
Source |
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http://dx.doi.org/10.1007/BF03179350 | DOI Listing |
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