We present spectroscopic measurements in which utilized are line-intensity ratios in the near-uv to measure electron energies of several hundred eVs, which usually necessitates the use of emission in the soft x-ray region. The main intensity ratio selected is of the BIII transition 1s(2)2s2S(1/2)-1s(2)2p2P3/2 (2066A) and the BIV transition 1s2s3S(1)-1s2p3P2 (2822A). A detailed atomic-kinetics modeling is made to demonstrate the usefulness of this atomic system for studying transient, ionizing plasmas. Here, it is applied for the characterization of high-electron energies (approximately 500 eV) generated due to the rapid penetration of a magnetic field pulse into a low-collisionality plasma. Limitations of the use of the method are discussed.
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http://dx.doi.org/10.1103/PhysRevE.78.036410 | DOI Listing |
J Biomed Phys Eng
December 2024
Department of Medical Physics and Engineering, School of Medicine, Shiraz University of Medical Sciences, Shiraz, Iran.
Background: Coronary heart disease the most prevalent form of cardiovascular disease, results from the blockage of blood flow through arteries. The Myocardial Perfusion Scan (MPS) is considered a non-invasive method to assess the heart condition and provides valuable information, such as End Diastolic Volume (EDV), End Systolic Volume (ESV), Ejection Fraction (EF), Lung to Heart Ratio (LHR), and Transient Ischemic Dilatation (TID).
Objective: This study aimed to investigate changes in gated heart scan parameters to diagnose patients, who are candidates for heart surgery.
Cureus
September 2024
Pediatrics, Ospedale Microcitemico, Cagliari, ITA.
Phys Rev Lett
September 2024
Centre for Light-Matter Interactions, Department of Physics and Astronomy, Queen's University Belfast, Belfast BT7 1NN, United Kingdom.
Clin Transl Radiat Oncol
November 2024
Laboratory for Analysis by Nuclear Reaction (LARN), Namur Research Institute for Life Sciences (NARILIS), University of Namur, Rue de Bruxelles 61, B-5000 Namur, Belgium.
Nanotechnology
October 2024
Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 511370, People's Republic of China.
This study investigates the response of nanowire field-effect transistors (NWFETs) to total ionizing dose (TID), single-event transient (SET), and their coupling effects in junctionless (JL), inversion (IM), and junctionless accumulation (AC) modes. The degradation of the three modes under irradiation and the effect of device bias configuration on the electrical properties of NWFETs are analyzed, and the different effects of SET on the three modes are compared. On this basis, the influence of TID on SET current generation and the charge collection mechanism are studied, and the changes in peak current, pulse width, and collected charge of transient current under different TIDs are compared.
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