AI Article Synopsis
- The paper introduces a new method for analyzing the relationship between structure and transport in nanoscale multilayer thin films using local current-voltage measurements.
- Local current-voltage characteristics are measured in real-time on cross-sectional TEM samples, allowing for direct correlation with TEM images of the microstructure at specific tunneling sites.
- The technique enables the detection of local variations in barrier properties and allows the extraction of tunneling barrier height and width.
Article Abstract
This paper describes a novel technique for studying structure-transport correlations in nanoscale multilayer thin films. Here, local current-voltage characteristics from simplified magnetic tunnel junctions are measured in situ on cross-sectional transmission electron microscopy (TEM) samples and correlated directly with TEM images of the microstructure at the tunneling site. It is found that local variations in barrier properties can be detected by a point probe method, and that the tunneling barrier height and width can be extracted.
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| http://dx.doi.org/10.1016/j.ultramic.2008.04.008 | DOI Listing |
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