AI Article Synopsis
- The study explores how electrical detection of spin echoes through echo tomography can reveal coherent processes in phosphorus donor electrons within silicon, especially near a SiO2 interface.
- By employing the Carr-Purcell pulse sequence, researchers observed an echo decay time constant of approximately 1.7 micros, shedding light on decoherence and recombination times.
- This electrical spin echo tomography technique can provide insights into the spin-dependent transport dynamics crucial for developing practical spin qubit devices in quantum computing.
Article Abstract
The electrical detection of spin echoes via echo tomography is used to observe coherent processes associated with the electrical readout of the spin state of phosphorus donor electrons in silicon near a SiO2 interface. Using the Carr-Purcell pulse sequence, an echo decay with a time constant of 1.7+/-0.2 micros is observed and discussed in terms of decoherence and recombination times. Electrical spin echo tomography thus can be used to study the dynamics of the spin-dependent transport processes, e.g., in realistic spin qubit devices for quantum information processing.
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| http://dx.doi.org/10.1103/PhysRevLett.100.177602 | DOI Listing |
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