AI Article Synopsis
- Scanning white-light interferometry is a technique used to analyze the microstructure of both technical and biological samples by capturing interferograms for each pixel.
- The paper explores optimal evaluation methods and discusses how the resolution of these methods is influenced by the setup parameters.
- Additionally, a comparison is made between the results of the proposed method and an existing algorithm found in literature.
Article Abstract
Scanning white-light interferometry is widely used for the microstructure analysis of technical and biological specimens. For each pixel in the focal plane of the apparatus a white-light interferogram is acquired and evaluated by means of an algorithm. We discuss some properties of mathematically optimal evaluation methods and the best possible achievable resolution derived therefrom depending on the setup parameters. A comparison of the results to one of the algorithms described in the literature is given.
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| http://dx.doi.org/10.1364/ao.40.002815 | DOI Listing |
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