Temperature sensitivity of passive holographic wavelength-division multiplexers-demultiplexers.

Appl Opt

Department of Electrical and Computer Engineering, University of Texas, Microelectronics Research Center, Austin, Texas 78758, USA.

Published: August 2000

We derive a set of concise formulas to characterize the temperature sensitivity of holographic wavelength-division multiplexers-demultiplexers (H-MUX's-H-DMUX's). The normalized parameters such as dispersion abilities, central wavelength shift rate, and variations of insertion loss hold for general grating-based wavelength-division multiplexing-demultiplexing (WDM-WDDM) structures. The results are applicable to both wide-WDM-WDDM and dense ones working in 800-, 1300-, and 1550-nm optical wavelength windows, regardless of whether their input-output ports are single-mode or multimode fibers. Detailed analysis and experiments are carried out on a fully packaged four-channel H-MUX-H-DMUX. The experimental results at temperatures from 25 to 80 degrees C fit nicely with the theoretical prediction. We conclude that passive grating-based H-MUX's-H-DMUX's are promising for meeting the requirements on temperature sensitivity in optical data communications and telecommunications. Most of the analysis can be applied to other types of Bragg-grating-based WDM-WDDM.

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http://dx.doi.org/10.1364/ao.39.004047DOI Listing

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