Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1034
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3152
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Experimental measurements are reported on voltage-controlled acoustic time-delay lines operating at 1 GHz in the nearly pure shear-horizontal (S-H) mode in 38 degrees rotated Y-cut LiNbO(3). The high-acoustic velocity (4800 m/s) in conjunction with the large electroacoustic effect exhibited by this orientation allows high-frequency operation and optimum time-delay tuning sensitivity with a planar, single surface, device geometry. The authors demonstrate fractional time delay of 0.3x10(-6) V(-1 ) for surface electrodes that produce an in-plane E-field. However, the simultaneous excitation and propagation of both a leaky surface-acoustic wave (LSAW) and surface skimming bulk wave (SSBW), both as (nearly pure) S-H waves in these devices, seriously restricts the extent to which it is possible to maximize the time delay modulation sensitivity by reducing electrode gap spacing as done in similar SAW devices. The LSAW and surface-skimming body wave (SSBW) propagate at nearly the same velocity on a free surface, and perturbation of their velocity and relative attenuation rates by surface electrodes causes pronounced interference effects between the two modes for some device geometries.
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Source |
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http://dx.doi.org/10.1109/58.8029 | DOI Listing |
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