We examine the possibility of using two- and three-phase systems suitable as standards for which the ellipsometric parameter ? remains insensitive to variations in the angle of incidence. These standards avoid propagation of errors in the angle of incidence with respect to the measured standard ? value. Different materials (dielectrics, metals, and semiconductors), adequate for the above purpose, are considered in different structure combinations, and their optical response are analyzed.

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http://dx.doi.org/10.1364/ao.37.005912DOI Listing

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