Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1034
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3152
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Electro-optic (EO) modulation devices, which utilize an external electric field to modulate a beam of optical radiation, are strongly affected by parasitic effects, which change the polarization state of the optical beam. As a result, very small changes in the birefringence or optical path length within the EO material can result in very large fluctuations of the amplitude and phase of the optical modulation signal. A method of actively analyzing the modulated beam is described and demonstrated, which eliminates these fluctuations and keeps the modulation device stably operating at its peak responsivity. Applications to electric field detection and measurements are discussed.
Download full-text PDF |
Source |
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http://dx.doi.org/10.1364/ao.46.006636 | DOI Listing |
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