Image-intensified photographs of delayed light emission (DLE) from soybean leaves exposed to sulfur dioxide showed evidence of the stress that developed during the exposure period. A comparison of DLE images taken during the fumigation with a conventional photograph taken 5 days later showed a clear correspondence between leaf areas that had the most diminished DLE intensity and those that showed the greatest visible injury. These results suggest that DLE imagery will be a useful tool in the investigation of the spatial distribution and temporal development of plant stress.
Download full-text PDF |
Source |
---|---|
http://dx.doi.org/10.1126/science.215.4536.1104 | DOI Listing |
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!