Light scattering from particles located under a rough dielectric layer.

J Opt Soc Am A Opt Image Sci Vis

The Jack and Pearl Resnick Institute of Advanced Technology, Department of Physics, Bar-Ilan University, Ramat-Gan, Israel.

Published: July 2007

A discussion is presented of the effect of roughness on the detectability of subsurface particles by means of the light-scattering method. We have studied the scattering of light by calibrated spheres located under a slightly rough dielectric surface both experimentally and theoretically. In our experiments, the scattering from slightly rough layers with nonresonant particles was dominated by the roughness, and the scattering diagram did not bear any discernible indications of the spheres. However, at resonance, the subsurface particles manifested themselves by an increase in the total scattered intensity and by well-pronounced maxima in the angular dependence of both the scattering diagram and the backscattered intensity. Theoretical calculations show that the angular positions of the maxima in the scattering diagram are essentially determined by the interference of fields scattered by the particles and by the surface, whereas the contribution of the multiple interparticle scattering is negligible. By contrast, the oscillations in the angular dependence of the backscattered intensity are due primarily to the scattering between neighboring spheres.

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Source
http://dx.doi.org/10.1364/josaa.24.001965DOI Listing

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