Multiple wave diffraction anomalous fine structure.

A new method, multiple-wave diffraction anomalous fine structure, combining the x-ray multiple-wave diffraction and diffraction anomalous fine structure techniques, is proposed. The real part of dispersion correction Deltaf' and fine structure chi function can be obtained directly by multiple diffraction analysis without using Kramers-Krönig relations and kinematical fitting of diffracted intensity. Better wave vector sensitivity of the fine structure is expected. The multiple-wave diffraction anomalous fine structure experiment for a GaAs single crystal is reported as an example.