Tunable Fröhlich polarons in organic single-crystal transistors.

Nat Mater

Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands.

Published: December 2006

AI Article Synopsis

  • In organic field-effect transistors (FETs), the movement of charge carriers is affected not just by the quality of the organic semiconductor but significantly by the nearby dielectric material as well.
  • Recent research has revealed that the temperature-dependent mobility of charges changes from metallic-like to insulating-like as the dielectric constant of the insulator increases.
  • This shift is explained by a two-dimensional Fröhlich polaron model, which highlights the impact of dielectric polarizability on the coupling strength between charge carriers and their environment, enhancing our understanding of charge transport in organic transistors.

Article Abstract

In organic field-effect transistors (FETs), charges move near the surface of an organic semiconductor, at the interface with a dielectric. In the past, the nature of the microscopic motion of charge carriers--which determines the device performance--has been related to the quality of the organic semiconductor. Recently, it was discovered that the nearby dielectric also has an unexpectedly strong influence. The mechanisms responsible for this influence are not understood. To investigate these mechanisms, we have studied transport through organic single-crystal FETs with different gate insulators. We find that the temperature dependence of the mobility evolves from metallic-like to insulating-like with increasing dielectric constant of the insulator. The phenomenon is accounted for by a two-dimensional Fröhlich polaron model that quantitatively describes our observations and shows that increasing the dielectric polarizability results in a crossover from the weak to the strong polaronic coupling regime. This represents a considerable step forward in our understanding of transport through organic transistors, and identifies a microscopic physical process with a large influence on device performance.

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Source
http://dx.doi.org/10.1038/nmat1774DOI Listing

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