The effect of the refractive index of the substrate together with the incident polarization on the optimization of sawtooth surface-relief gratings (SRGs) is investigated. The global optimum diffraction efficiencies of the -1st forward-diffracted order of sawtooth SRGs are 63.3% occurring at n2=1.47 for TE polarization and 73.8% occurring at n2=2.88 for TM polarization. Incident TE polarization has higher optimum diffraction efficiency than TM polarization for all n2<1.85. In contrast, TM polarization has higher optimum diffraction efficiency than TE polarization for all n2>1.85. A polymer (n2=1.5) optimum sawtooth SRG exhibits 62.6% efficiency for TE polarization. A silicon (n2=3.475) optimum sawtooth SRG exhibits 68.6% efficiency for TM polarization. These sawtooth SRGs are compared to right-angle-face trapezoidal SRGs. It is found that the optimum profiles of right-angle-face trapezoidal SRGs have only very slightly increased efficiencies over sawtooth SRGs (0.04% for TE and 0.55% for TM).
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http://dx.doi.org/10.1364/ao.45.003420 | DOI Listing |
Appl Opt
May 2006
School of Electrical and Computer Engineering, Microelectronics Research Center, Georgia Institute of Technology, Atlanta 30332, USA.
The effect of the refractive index of the substrate together with the incident polarization on the optimization of sawtooth surface-relief gratings (SRGs) is investigated. The global optimum diffraction efficiencies of the -1st forward-diffracted order of sawtooth SRGs are 63.3% occurring at n2=1.
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