AI Article Synopsis
- The paper outlines a method for estimating uncertainty in measuring iron (Fe) in metallic silicon using ICP-AES technology.
- It introduces a technique called averaged moving range (MR) pooled in statistical dynamic monitor, which combines quality control and linear fitting.
- The findings aim to simplify the evaluation of measurement uncertainty by effectively managing variance contributions without complicated relationships.
Article Abstract
This paper describes how to estimate the uncertainty when Fe in metallic silicon is determined by ICP-AES (Inductively Coupled Plasma Atomic Emission Spectrometry). The technique of the averaged moving range (MR) pooled in-statistical-dynamic-monitor is proposed. The study suggests that the uncertainty contribution of ICP-AES measurement system is, by using this technique, a combination of quality control (QC) and linear fit. This conclusion maximized the combination of the effects on various variances, refrained from the complicated relativity, and favored the uncertainty evaluation for ICP-AES measurement system.
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