Tip-enhanced fluorescence microscopy at 10 nanometer resolution.

Phys Rev Lett

Department of Applied Physics, California Institute of Technology, MC 128-95, Pasadena, CA 91125, USA.

Published: October 2004

We demonstrate unambiguously that the field enhancement near the apex of a laser-illuminated silicon tip decays according to a power law that is moderated by a single parameter characterizing the tip sharpness. Oscillating the probe in intermittent contact with a semiconductor nanocrystal strongly modulates the fluorescence excitation rate, providing robust optical contrast and enabling excellent background rejection. Laterally encoded demodulation yields images with <10 nm spatial resolution, consistent with independent measurements of tip sharpness.

Download full-text PDF

Source
http://dx.doi.org/10.1103/PhysRevLett.93.180801DOI Listing

Publication Analysis

Top Keywords

tip-enhanced fluorescence
4
fluorescence microscopy
4
microscopy nanometer
4
nanometer resolution
4
resolution demonstrate
4
demonstrate unambiguously
4
unambiguously field
4
field enhancement
4
enhancement apex
4
apex laser-illuminated
4

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!