AI Article Synopsis
- A new X-ray Michelson interferometer was tested at the SPring-8 beamline, building on the existing BBB interferometer design.
- The test involved using a piezo to adjust one mirror, which allowed researchers to observe changes in intensity related to path-length differences.
- The results confirmed the expected fringe patterns, highlighting the need for a stable environment due to the small mirror displacement necessary for accurate measurements.
Article Abstract
A new X-ray Michelson interferometer based on the BBB interferometer of Bonse and Hart and designed for X-rays of wavelength approximately 1 A was described in a previous paper. Here, a further test carried out at the SPring-8 1 km beamline BL29XUL is reported. One of the BBB's mirrors was displaced by a piezo to introduce the required path-length difference. The resulting variation of intensity with piezo voltage as measured by an avalanche photodiode could be ascribed to the phase variation resulting from the path-length change, with a small additional contribution from the change of the position of the lattice planes of the front mirror relative to the rest of the crystal. This 'Michelson fringe' interpretation is supported by the observed steady movement across the output beam of the interference fringes produced by a refractive wedge when the piezo voltage was ramped. The front-mirror displacement required for one complete fringe at the given wavelength is only 0.675 A; therefore, a quiet environment is vital for operating this device, as previous experiments have shown.
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