Self-ordering of nanofacets on vicinal SiC surfaces.

Phys Rev Lett

Research Institute for Electronic Science, Hokkaido University, Sapporo 060-0812, Japan.

Published: November 2003

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Article Abstract

Vicinal 4H and 6H-SiC(0001) surfaces have been investigated using atomic force microscopy and cross-sectional high-resolution transmission electron microscopy. We observed the characteristic self-ordering of nanofacets on any surface, regardless of polytypes and vicinal angles, after gas etching at high temperature. Two facet planes are typically revealed: (0001) and high index (112;n) that are induced by equilibrium surface phase separation. A (112;n) plane may have a free energy minimum due to attractive step-step interactions. The differing ordering distances in 4H and 6H polytypes imply the existence of SiC polytypic dependence on nanofaceting. Thus, it should be possible to control SiC surface nanostructures by selecting a polytype, a vicinal angle, and an etching temperature.

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http://dx.doi.org/10.1103/PhysRevLett.91.226107DOI Listing

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