AI Article Synopsis
- A new symmetry X system has been developed for accurately measuring the reflectance and transmittance of surfaces in the infrared spectrum, designed for integration with commercial Fourier-transform infrared spectrometers.
- Despite using ten mirrors in its setup, the system's findings show that the average reflectance can be calculated without needing to consider each mirror's individual characteristics or losses.
- The system not only provides high-accuracy measurements quickly but also allows for self-checking of results and the ability to conduct simultaneous reflectance and transmittance measurements, which enhances the understanding of measurement uncertainties; its design is applicable for various wavelengths beyond infrared.
Article Abstract
A symmetry X system that has been constructed for the absolute measurements of reflectance and transmittance of specular samples in the infrared region is described. The system has been designed so that it can be incorporated into commercial Fourier-transform infrared spectrometers. Although ten mirrors were used in this system, it is disclosed that the geometric mean of two reflectance values is independent of the reflectance difference of the individual mirrors and the optical loss at each mirror. This system achieves spectral measurements with high accuracy and within a short period of time. In particular, the system affords us the self-diagnostic ability for measured spectra, and the simultaneous measurements of reflectance and transmittance under the same geometry enable us to evaluate measurement uncertainties. Although the symmetry X system is used for infrared spectral measurements, the measurement method, design principles, and features are generally applicable to other wavelengths as well.
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| http://dx.doi.org/10.1364/ao.42.005064 | DOI Listing |
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