[A study on the relation between the location of brain damage and agraphia of Chinese].

Objective: To investigate the relation between the location of brain damage and Chinese agraphia.

Methods: Aphasia Battery of Chinese (ABC) and Chinese Agraphia Battery (CAB) were used to examine the ability of oral language and writing. Different types of aphasia and agraphia were detected. Computerized image-processing technology was used to standardize and reconstruct the skull CT/MRI images. The results substracted from the normal controls were shown directly.

Results: 48 patients had lesions on the left brain among them 30 were aphasic and 32 were agraphic. 15 had lesions on the right brain, among them 3 were aphasic and agraphic. The image-processing results showed that the nidi of aphasic agraphia located on the left deep albae of frontal and parietal lobe, the nidi of persistent agraphia located on the posterior parts of the left 1st and 2nd gyrus of frontal lobe and the nidi of mirror agraphia were dispersed near the left basal ganglion and thalamus.

Conclusions: It is found that there is a relationship between Chinese agraphia and the location of brain damage. Some parts may be responsible for some special writing ability.