Substrate-strain-induced tunability of dense wavelength-division multiplexing thin-film filters.

Opt Lett

Institut Fresnel, Unité Mixte de Recherche 6133 du Centre National de la Recherche Scientifique, Ecole Nationale Supérieure de Physique de Marseille, Domaine Universitaire de Saint-Jérôme, 13397 Marseille Cedex 20, France.

Published: May 2003

AI Article Synopsis

  • Classic dense wavelength-division multiplexing (DWDM) thin-film filters can be adjusted in their wavelength response by applying strain to their substrate.
  • The study examines how uniform, uniaxial compressive stress affects the design wavelength of narrow-bandpass filters and compares the theoretical calculations with experimental results.
  • Measurements of a 200-GHz standard filter's transmittance under various stress conditions help quantify how insertion losses are affected by the applied strain.

Article Abstract

Classic dense wavelength-division multiplexing thin-film filters can be spectrally tuned through the substrate's strain. We analyze the theoretical shift of the design wavelength of a narrow-bandpass filter when uniform, uniaxial compressive stress is applied to the substrate, and we compare calculated sensitivity with experimental data. We measure the transmittance shape of a 200-GHz standard filter for several loading cases to quantify the increase of insertion losses.

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Source
http://dx.doi.org/10.1364/ol.28.000728DOI Listing

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