Classic dense wavelength-division multiplexing thin-film filters can be spectrally tuned through the substrate's strain. We analyze the theoretical shift of the design wavelength of a narrow-bandpass filter when uniform, uniaxial compressive stress is applied to the substrate, and we compare calculated sensitivity with experimental data. We measure the transmittance shape of a 200-GHz standard filter for several loading cases to quantify the increase of insertion losses.
Download full-text PDF |
Source |
---|---|
http://dx.doi.org/10.1364/ol.28.000728 | DOI Listing |
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!