The experimental station for measuring X-ray absorption spectra in total reflection geometry operative at the GILDA CRG beamline of ESRF is described. The main features of the station are shown, namely: the possibility of detecting very small signals from thin (a few ML) samples, of depositing thin films under controlled conditions and thermal treating the samples in order to study dynamical processes. Case studies are reported in order to show the performances of the apparatus.
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http://dx.doi.org/10.1107/s0909049503005582 | DOI Listing |
Rev Sci Instrum
January 2007
Institute of Materials Science of Seville-Inorganic Chemistry Department, CSIC-University of Seville, Ad. Americo Vespucio, Seville, Spain.
The development of the capability to engineer the surface properties of materials to match specific requirements demands high quality surface characterization techniques. The ideal tool should provide chemically specific structural characterization as well as surface sensitivity and depth profiling. Ideally the characterization method should also be applicable to systems both with and without long range order.
View Article and Find Full Text PDFJ Synchrotron Radiat
May 2003
European Synchrotron Radiation Facility, GILDA CRG, INFM OGG, 6 Rue Jules Horowitz F-38043, France.
The experimental station for measuring X-ray absorption spectra in total reflection geometry operative at the GILDA CRG beamline of ESRF is described. The main features of the station are shown, namely: the possibility of detecting very small signals from thin (a few ML) samples, of depositing thin films under controlled conditions and thermal treating the samples in order to study dynamical processes. Case studies are reported in order to show the performances of the apparatus.
View Article and Find Full Text PDFEnter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!