An approach to X-ray attenuation correction for diffraction anomalous fine-structure (DAFS) measurements is presented, taking into account energy-dependent secondary extinction effects. A numerical model based on the kinematical theory of diffraction is presented. This model is exemplified by DAFS measurements of the Zr 0002 reflection intensities for energies in the vicinity of the Zr K absorption edge of a Co/Zr multilayer exhibiting strong fibre texture. X-ray absorption fine-structure (XAFS) measurements proved to be a necessary auxiliary for DAFS amplitude correction.
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