In the framework of current development in 157-nm lithography we have investigated the performance of photodetectors with emphasis to their stability and linearity. The measurements were performed in the radiometry laboratories of the Physikalisch-Technische Bundesanstalt at the Berlin electron-storage rings BESSY I and BESSY II with spectrally dispersed synchrotron radiation as well as with highly pulsed F2 laser radiation at 157 nm in combination with a cryogenic radiometer as the primary detector standard. Relative standard uncertainties of as little as 1% were achieved for the calibration of photodetectors in the spectral range of ultraviolet and vacuum-ultraviolet radiation.
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http://dx.doi.org/10.1364/ao.41.007167 | DOI Listing |
We have developed a 157-nm coherent light source by two-photon resonant four-wave mixing in Xe, with two tunable single-mode 1-kHz Ti:sapphire laser systems at 768 and 681 nm. This light source has been developed to determine the instrumental function of a vacuum ultraviolet spectrometer and to evaluate optical designs for ultra-line-narrowed F(2) laser lithography. The spectral linewidth of the source was less than 0.
View Article and Find Full Text PDFImmersion interference lithography was used to pattern gratings with 22-nm half pitch. This ultrahigh resolution was made possible by using 157-nm light, a sapphire coupling prism with index 2.09, and a 30-nm-thick immersion fluid with index 1.
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June 2005
Materials Science and Engineering, Cornell University, 310 Bard Hall, Ithaca, NY 14853, USA.
Fluorinated polymers form an interesting class of materials with a wealth of unique properties including self-assembly, remarkably low surface energies, low absorbance to 157 nm UV light, and solubility in supercritical carbon dioxide. As a result many fluorinated polymers are of use in advanced technology applications. We review some of our work on the synthesis and characterization of block copolymers with fluorinated side chains, with special emphasis on surfaces formed using these polymers.
View Article and Find Full Text PDFAppl Opt
April 2004
Department of Material Science and Engineering, National Taiwan University, Taipei, Taiwan.
We demonstrate an optical-gradient bottom antireflective coating (BARC) film, which can be easily prepared by treating a silicon nitride film with oxygen plasma. The oxygen composition is gradually decreased inside the silicon nitride film. The optical constants of the silicon nitride film are also changed gradually.
View Article and Find Full Text PDFAppl Opt
December 2002
Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12,10587 Berlin, Germany.
In the framework of current development in 157-nm lithography we have investigated the performance of photodetectors with emphasis to their stability and linearity. The measurements were performed in the radiometry laboratories of the Physikalisch-Technische Bundesanstalt at the Berlin electron-storage rings BESSY I and BESSY II with spectrally dispersed synchrotron radiation as well as with highly pulsed F2 laser radiation at 157 nm in combination with a cryogenic radiometer as the primary detector standard. Relative standard uncertainties of as little as 1% were achieved for the calibration of photodetectors in the spectral range of ultraviolet and vacuum-ultraviolet radiation.
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