The calculated spectral transmittance of a multilayer laser mirror is used to determine the effective index of the single layer equivalent to the multilayer stack. We measure the artificial anisotropy of photoresist thin films whose structure is a one-dimensional, subwavelength grating obtained from interference fringes. The limitation of the theory of the first-order effective index homogenization is discussed. We designed normal-incidence, polarizing coating and a polarization rotator by embedding anisotropic films in simple multilayer structures.
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