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http://dx.doi.org/10.1103/physrevb.46.9744 | DOI Listing |
ACS Appl Mater Interfaces
January 2025
Grundlagen von Energiematerialien, Institut für Physik, Technische Universität Ilmenau, 98693 Ilmenau, Germany.
To date, III-V semiconductor-based tandem devices with GaInP top photoabsorbers show the highest solar-to-electricity or solar-to-fuel conversion efficiencies. In photoelectrochemical (PEC) cells, however, III-V semiconductors are sensitive, in terms of photochemical stability and, therefore, require suitable functional layers for electronic and chemical passivation. GaN films are discussed as promising options for this purpose.
View Article and Find Full Text PDFSci Technol Adv Mater
January 2025
Magnetic Functional Device Group, Research Center for Magnetic and Spintronic Materials (CMSM), National Institute for Materials Science (NIMS), Tsukuba, Japan.
We demonstrate high-throughput evaluation of the half-metallicity of CoMnSi Heusler alloys by spin-integrated hard X-ray photoelectron spectroscopy (HAXPES) of composition-spread films performed with high-brilliance synchrotron radiation at NanoTerasu, which identifies the optimum composition showing the best half-metallicity. Co Mn Si composition-spread thin films for = 10-40% with a thickness of 30 nm are fabricated on MgO(100) substrates using combinatorial sputtering technique. The 2-ordering and (001)-oriented epitaxial growth of CoMnSi are confirmed by X-ray diffraction for = 18-40%.
View Article and Find Full Text PDFACS Appl Mater Interfaces
January 2025
Department of Chemistry, University of Illinois Urbana-Champaign, Urbana, Illinois 61801, United States.
ACS Appl Mater Interfaces
January 2025
Department of Materials Science and Engineering, Chosun University, Gwangju 61452, Korea.
With the applications of in situ X-ray diffraction (XRD), electrical - measurement, and ambient pressure hard X-ray photoelectron spectroscopy (AP-HAXPES), the characteristics of the topotactic phase transition of LaCoO (LCO) thin films are examined. XRD measurements show clear evidence of structural phase transition (SPT) of the LCO thin films from the perovskite (PV) LaCoO to the brownmillerite (BM) LaCoO phases through the intermediate LaCoO phase at a temperature of 350 °C under high-vacuum conditions, ∼10 mbar. The reverse SPT from BM to PV phases is also found under ambient pressure (>100 mbar) of air near 100 °C.
View Article and Find Full Text PDFAcc Chem Res
January 2025
Department of Chemical and Petroleum Engineering, University of Kansas, Lawrence, Kansas 66045, United States.
ConspectusThe surface of a catalyst is crucial for understanding the mechanisms of catalytic reactions at the molecular level and developing new catalysts with higher activity, selectivity, and durability. Ambient pressure X-ray photoelectron spectroscopy (AP-XPS) is a technique studying the surface of a sample in the gas phase, mainly identifying chemical identity, analyzing oxidation state, and measuring surface composition.In the last decade, numerous photoelectron spectroscopic methods for fundamental studies of key topics in catalysis using AP-XPS have been developed.
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