Publications by authors named "Zhaorui Zou"

Valence change memory (VCM) attracts numerous attention in memory applications, due to its high stability and low energy consumption. However, owing to the low on/off ratio of VCM, increasing the difficulty of information identification hinders the development of memory applications. We prepared N-doped NbO:N films (thickness = approximately 15 nm) by pulsed laser deposition at 200 °C.

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In this work, undoped, N-doped, WO₃-loaded undoped, and WO₃-loaded with N-doped TiO₂ rutile single-crystal wafers were fabricated by direct current (DC) magnetron sputtering. N-doping into TiO₂ and WO₃ loading onto TiO₂ surface were used to increase and decrease oxygen vacancies. Various measurements were conducted to analyze the structural and magnetic properties of the samples.

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