Research on calculation of surface irradiance for infrared extended sources based on CUDA parallel speedup.

To correct the error caused by uneven distribution of target surface irradiance in the measurement of emissivity by the irradiation reflection method, a progressive method for calculating the surface irradiance for infrared extended sources was proposed, and its CPU-GPU heterogeneous operation speedup was realized based on the compute unified device architecture (CUDA). The proposed method calculated the radiation transfer at the scale of small surface sources while considering the multiple reflections between the sources, which better reflected the actual physical condition. The CUDA-based parallel speedup enabled calculation within a few seconds even for several data levels, which facilitated pixel-by-pixel analysis of surface emissivity measurements.

Study on Method for Measuring Coating Emissivity by Applying Active Irradiation Based on Infrared Thermal Imager.

To achieve rapid and precise non-contact measurements of coating emissivity at room temperature, a measurement method based on infrared thermal imager was proposed. By applying two irradiations with different energies to the target and reference surfaces, the influences of atmospheric transmittance, radiation of the target itself, environmental radiation, and atmospheric path radiation were eliminated, thereby enabling accurate emissivity measurement. Experiments were designed for validation with a mid-wave infrared thermal imager and a surface blackbody as the radiation source.