Gas-cluster ion sputtering: Effect on organic layer morphology.

Analysis of the surface of thin Irganox 1010 films before and after sputtering with an argon gas-cluster ion beam was performed with AFM and XPS to determine the effect that Zalar rotation has on the chemistry and morphology of the surface. The analysis is based on the change in roughness of the surface by comparing the same location on the surface before and after sputtering. The ion beam used was an of size = 1000 and energy 4 keV.

ToF-SIMS imaging of molecular-level alteration mechanisms in by Henri Matisse.

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has recently been shown to be a valuable tool for cultural heritage studies, especially when used in conjunction with established analytical techniques in the field. The ability of ToF-SIMS to simultaneously image inorganic and organic species within a paint cross section at micrometer-level spatial resolution makes it a uniquely qualified analytical technique to aid in further understanding the processes of pigment and binder alteration, as well as pigment-binder interactions. In this study, ToF-SIMS was used to detect and image both molecular and elemental species related to CdS pigment and binding medium alteration on the painting (1905-1906, The Barnes Foundation) by Henri Matisse.