A modified multibond model for nanoscale static friction.

Several key features of nanoscale friction phenomena observed in experiments, including the stick-slip to smooth sliding transition and the velocity and temperature dependence of friction, are often described by reduced-order models. The most notable of these are the thermal Prandtl-Tomlinson model and the multibond model. Here we present a modified multibond (mMB) model whereby a physically-based criterion-a critical bond stretch length-is used to describe interfacial bond breaking.

Ultrahigh strength and shear-assisted separation of sliding nanocontacts studied in situ.

The behavior of materials in sliding contact is challenging to determine since the interface is normally hidden from view. Using a custom microfabricated device, we conduct in situ, ultrahigh vacuum transmission electron microscope measurements of crystalline silver nanocontacts under combined tension and shear, permitting simultaneous observation of contact forces and contact width. While silver classically exhibits substantial sliding-induced plastic junction growth, the nanocontacts exhibit only limited plastic deformation despite high applied stresses.

Covalent Bonding and Atomic-Level Plasticity Increase Adhesion in Silicon-Diamond Nanocontacts.

Nanoindentation and sliding experiments using single-crystal silicon atomic force microscope probes in contact with diamond substrates in vacuum were carried out in situ with a transmission electron microscope (TEM). After sliding, the experimentally measured works of adhesion were significantly larger than values estimated for pure van der Waals (vdW) interactions. Furthermore, the works of adhesion increased with both the normal stress and speed during the sliding, indicating that applied stress played a central role in the reactivity of the interface.

Sliding History-Dependent Adhesion of Nanoscale Silicon Contacts Revealed by in Situ Transmission Electron Microscopy.

Nanoscale asperity-on-asperity sliding experiments were conducted using a nanoindentation apparatus inside a transmission electron microscope, allowing for atomic-scale resolution of contact formation, sliding, and adhesive separation of two silicon nanoasperities in real time. The formation and separation of the contacts without sliding revealed adhesion forces often below detectable limits (ca. 5 nN) or at most equal to values expected from van der Waals forces.