Publications by authors named "Yue-Min Wan"

Study on single electron tunnel using current-voltage characteristics in nanopillar transistors at 298 K show that the mapping between the N electron excited in the central box ∼8.5 × 8.5 × 3 nm and the N tunnel peak is not in the one-to-one correspondence to suggest that the total number N of electrons is not the best quantum number for characterizing the quality of single electron tunnel in a three-dimensional quantum box transistor.

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