Volume polarization holographic recording in thick phenanthrenequinone-doped poly(methyl methacrylate) photopolymer.

Volume polarization holographic recording in phenanthrenequinone-doped poly (methyl methacrylate) photopolymer is obtained. Photoinduced birefringence in a 2 mm thick sample is measured by a phase-modulated ellipsometry. The birefringence induced in this material by linearly polarized beam at 514 nm reaches 1.

Deassociate the initial temporal phase deviation provided by photoelastic modulator for stroboscopic illumination polarization modulated ellipsometry.

In addition to operating the imaging ellipsometric measurements by four-specific temporal phases in the photoelastic modulated ellipsometry, we added the fifth one to solve the initial phase of the photoelastic modulator. This methodology has been developed to conquer the slow imaging processing of charge-coupled device camera for the stroboscopic illumination in the polarization modulated imaging ellipsometry. Without any calibration in its initial phase, we can perform the ellipsometric measurement by the measurements of intensity at five-specific temporal phases.

Optimization of a four-temporal phase lock for photoelastic-modulated polarimetry.

A set of four-temporal phases in photoelastic-modulated polarimetry is proposed to measure the Stokes parameters. In comparison with the conventional polarimetry, which uses a set of four-spatial angles by rotating a quarter-wave plate to obtain the polarimetric parameters, this temporal type polarimetry not only can reduce the time consumption but also can avoid the measurement error from the beam deviation. In addition, based on singular value decomposition, the figure of merit of this temporal phase technique can improve its signal-to-noise ratio by a factor of 2 in comparison with the rotating quarter-wave plate.

Determining thickness of films on a curved substrate by use of ellipsometric measurements.

A three-intensity measurement technique has been employed in polarizer-sample-analyzer imaging ellipsometry to measure the two-dimensional ellipsometric parameters of a coated cylindrical lens. Since azimuth deviation alpha of a polarizer can also be measured with this three-intensity measurement technique, we tilted a well-calibrated thin-film wafer to identify the orientation of the measured alphawith respect to the incident plane. Using the analytic property of this measurement technique, we can correct the deviation and determine the thickness profile of the thin film coated on a cylindrical lens.

Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry.

The analytical solutions of the azimuthal deviation of a polarizer and an analyzer were obtained by polarizer-sample-analyzer ellipsometry with a three-intensity measurement technique. By performing two sets of this three-intensity measurement with the polarizer's azimuth set at 45 degrees and at -45 degrees , we were able to obtain a set of ellipsometric parameters free from the azimuthal deviations of the polarizer and the analyzer.

Determination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferometric ellipsometry.

What is believed to be a novel phase-sensitive optical heterodyne interferometric ellipsometer is set up to characterize a twisted-nematic liquid crystal (TN-LC) by the elliptical parameters of the output polarization state. This ellipsometer presents the advantages of both polarized optical heterodyne interferometry and optical photometry, which introduce a polarization modulation that is capable of performing with high-sensitivity on phase detection in real time. The twist angle phi and the untwisted phase retardation gamma of TN-LC are measured precisely.