Investigations have been made to explore the applicability of an off-the-shelf deep convolutional neural network (DCNN) architecture, residual neural network (ResNet), to the classification of the crystal structure of materials using electron diffraction patterns without prior knowledge of the material systems under consideration. The dataset required for training and validating the ResNet architectures was obtained by the computer simulation of the selected area electron diffraction (SAD) in transmission electron microscopy. Acceleration voltages, zone axes, and camera lengths were used as variables and crystal information format (CIF) files obtained from open crystal data repositories were used as inputs.
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