Publications by authors named "Yoonseok Baek"

Surface topology measurements of micro- or nanostructures are essential for both scientific and industrial applications. However, high-throughput measurements remain challenging in surface metrology. We present single-shot full-field surface topography measurement using Kramers-Kronig holographic imaging and spectral multiplexing.

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Quantitative phase imaging (QPI) exploits sample-induced changes in the optical field to analyze biological specimens in a label-free manner. However, the quantitative nature of QPI makes it susceptible to optical aberrations. We propose a method for calibrating pupil aberrations by imaging a sample of interest.

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Optical diffraction tomography measures the three-dimensional refractive index map of a specimen and visualizes biochemical phenomena at the nanoscale in a non-destructive manner. One major drawback of optical diffraction tomography is poor axial resolution due to limited access to the three-dimensional optical transfer function. This missing cone problem has been addressed through regularization algorithms that use a priori information, such as non-negativity and sample smoothness.

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Optical diffraction tomography (ODT) is a three-dimensional (3D) label-free imaging technique. The 3D refractive index distribution of a sample can be reconstructed from multiple two-dimensional optical field images via ODT. Herein, we introduce a temporally low-coherence ODT technique using a ferroelectric liquid crystal spatial light modulator (FLC SLM).

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The development of optical and computational techniques has enabled imaging without the need for traditional optical imaging systems. Modern lensless imaging techniques overcome several restrictions imposed by lenses, while preserving or even surpassing the capability of lens-based imaging. However, existing lensless methods often rely on a priori information about objects or imaging conditions.

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We found an error in Fig. 1 of our article "White-light Quantitative Phase Imaging Unit." Here we publish the revised figure.

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We introduce the white-light quantitative phase imaging unit (WQPIU) as a practical realization of quantitative phase imaging (QPI) on standard microscope platforms. The WQPIU is a compact stand-alone unit which measures sample induced phase delay under white-light illumination. It does not require any modification of the microscope or additional accessories for its use.

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