Publications by authors named "Yiao Tee Hsia"

Atomic force microscopy (AFM) was used to measure the disjoining pressures of perfluoropolyether lubricant films (0.8-4.3 nm of Fomblin Z03) on both silicon wafers and hard drive disks coated with a diamondlike carbon overcoat.

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We have identified conditions in which the atomic force microscope can be used to stretch a meniscus of a perfluoropolyether (PFPE) lubricant pinned between an AFM tip and a nanometer-thick PFPE film to obtain the disjoining pressure of the film. Under quasi-equilibrium conditions, the chemical potential of the film can be equated to that of the stretched meniscus. A theory is presented that provides a complete description of the capillary force of a stretched meniscus.

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The disjoining pressure of lubricant nanofilms used in the magnetic recording industry controls the equilibrium wetting, the dynamics of film restoration, and the evaporation kinetics of the film. It has been claimed that by measuring the contact angle of nonpolar and polar liquids on lubricant films, the disjoining pressure can be extracted using the method of Girafalco and Good, and such analyses have appeared in the literature. The approximations underlying the method have been discussed before in the literature.

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