Aim: To analyze the management of patients with associated complications from hypertension to improve prehospital therapeutic and diagnostic care.
Material And Methods: The accounts and records (125,905 calling cards over 2012-2014) of the Statistics Division, Karaganda Regional First Aid Station, were used. The methods of clinical and mathematical analysis were applied.
Angle-resolved scattering (ARS) intensities were measured in the backscattering hemisphere for the (1 0 0) and (1 1 1) faces of GaAs single crystals. Three epitaxial layers were deposited onto the GaAs (1 0 0) single-crystalline wafers. The laser elastic light scattering shows the presence of a regular surface microrelief whose orientation corresponds to the crystallographic axes in the surface plane.
View Article and Find Full Text PDFAngular dependencies of the scattered light intensity were measured on Si wafers that have different crystallographic orientations by using a He-Ne laser (λ = 632.8 nm, 80 µm spot diameter). During the experiment the Si wafer was fixed relative to the incident beam.
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