Supramolecular phosphorescent assemblies based on cucurbit[8]uril and bromophenylpyridine derivatives for dazomet recognition.

A bromophenylpyridine derivative (N1) was designed, synthesized, and the molecule was incorporated into the cavity of the cucurbit[8]uril (Q[8]) as a guest to form a 2:1 host-guest complex. This complex demonstrates good room temperature phosphorescence (RTP) properties in aqueous solution. The host-guest interaction and optical properties of N1@Q[8] in aqueous solution were studied by means of H NMR, ultraviolet-visible absorption spectroscopy, fluorescence spectroscopy, phosphorescence spectroscopy, scanning electron microscopy and inverted fluorescence microscopy.

Extra-detection-free monoscopic deflectometry for the in situ measurement of freeform specular surfaces.

Extra detections of feature points conducted by a third-party instrument are indispensable in the monoscopic deflectometry to specify the surface position, but the measuring capability can be limited because most freeform surfaces do not contain any distinguishable and detectable feature points. In this Letter, the behaviors of the position error and form error of the measured surface are discriminated by reverse ray-tracing. A novel iterative optimization strategy is developed to position the workpiece for the in situ deflectometric measurement so that extra detections can be avoided.

Efficient phase retrieval of two-directional phase-shifting fringe patterns using geometric constraints of deflectometry.

In the phase measuring deflectometry, two groups of fringe patterns in orthogonal directions are usually applied to establish the correspondences between the pixel pairs on the screen and camera. Usually, 16 phase-shifting fringe patterns with different spatial frequencies are required in order to calculate the absolute phases in the conventional temporal phase unwrapping algorithms. This requirement makes the measurement inefficient and not robust against environmental noise.

Self-calibration of in situ monoscopic deflectometric measurement in precision optical manufacturing.

Accurate in situ measurement of complex optical surfaces is desired for precision manufacturing, and deflectometry is a promising measuring method. However, deflectometry's measurement accuracy depends heavily on the geometric calibration's reliability. Existing calibration methods suffer from the limitations of low efficiency, complicated operations, and expensive equipment.