A twelve-analyzer detector system for high-resolution powder diffraction.

A dedicated high-resolution high-throughput X-ray powder diffraction beamline has been constructed at the Advanced Photon Source (APS). In order to achieve the goals of both high resolution and high throughput in a powder instrument, a multi-analyzer detector system is required. The design and performance of the 12-analyzer detector system installed on the powder diffractometer at the 11-BM beamline of APS are presented.

Observation of a low-viscosity interface between immiscible polymer layers.

X-ray photon correlation spectroscopy was employed in a surface standing wave geometry in order to resolve the thermally driven in-plane dynamics at both the surface/vacuum (top) and polymer/polymer (bottom) interfaces of a thin polystyrene (PS) film on top of Poly(4-bromo styrene) (PBrS) and supported on a Si substrate. The top vacuum interface shows two relaxation modes: one fast and one slow, while the buried polymer-polymer interface shows a single slow mode. The slow mode of the top interface is similar in magnitude and wave vector dependence to the single mode of the buried interface.

Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces.

We have used measurements of the absolute intensity of diffuse X-ray scattering to extract the interfacial tension of a buried polymer/polymer interface. Diffuse scattering was excited by an X-ray standing wave whose phase was adjusted to have a high intensity at the polymer/polymer interface and simultaneously a node at the polymer/air interface. This method permits the capillary-wave-induced roughness of the interface, and hence the interfacial tension, to be measured independently of the polymer/polymer interdiffusion.