A Normalized Congruent Matching Area Method for the Correlation of Breech Face Impression Images.

The congruent matching cells (CMC) method was invented at the National Institute of Standards and Technology (NIST) for firearm evidence identification and error rate estimation. The CMC method divides the correlated image pairs into cells and uses four parameters to quantify topography similarity and pattern congruency of the correlated cell pairs in firearm breech face impressions on fired cartridge cases. A preliminary conservative numerical identification criterion of = 6 CMCs was suggested for identifying images of cartridge cases fired from the same firearm.

Application of 3 × 3 transformation matrix in the correction of three-dimensional AFM image tilts through coordinate transformation.

In atomic force microscopy (AFM), it is difficult to maintain samples in a perfect horizontal position on the piezoelectric stage of an AFM to obtain accurate measurement of surface features and to enhance the visual effect of topographic images. Correction of the tilted image therefore requires the use of an appropriate 3 × 3 transformation matrix which will transform the coordinates to simultaneously correct the tilt in both the x-and y-axes due to the three-dimensional nature of AFM images. In this study, application of transformation matrix in three-dimensions for the simultaneous correction of image tilts in both the x- and y-axes by the method of coordinate transformation in three-dimensions is presented.

An operating method with lateral scan for reducing the error in topography caused by the tip-sample angle in atomic force microscopy.

The atomic force microscopes (AFM) images are obtained by keeping the bending of the cantilever unchanged in contact mode. However, it is found that changes in the tip-sample angle during parallel scan result in error in the topographic image. It is also discovered that measurement results obtained in the blind scan region contained large errors.

Application of triangular atomic force microscopy cantilevers to friction measurement with the improved parallel scan method.

The atomic force microscopy (AFM) can provide tribological information in micro/nanoscale. However, the general measurement techniques require rigorous value of stiffness and relationship between AFM cantilever deformation and corresponding photodetector response. In this study, triangular AFM cantilevers with different dimensions are applied to quantitatively measure the coefficient of friction with the improved parallel scan method [Y.

Improved parallel scan method for nanofriction force measurement with atomic force microscopy.

Based on Ruan and Bhushan's study [J. Ruan and B. Bhushan, J.