Effect of thermal stress on the life of DC link capacitors for smart grid.

Thermal stress is an important factor affecting the life of a DC link capacitor (DCLC). However, relevant studies on thermal stress mechanism directly influencing the lifetime of the capacitor are rarely reported. In this paper, the heat setting and thermal stress of DCLC has been analyzed, and the relevant experimental platforms have been developed to evaluate the breakdown strength of DCLC at two heat setting temperatures (HSTs).