Spectroscopy of correlated electron pairs was employed to investigate the energy dissipation process, as well as the transport and the emission of low-energy electrons on a polymethylmethacrylate surface, providing secondary electron spectra causally related to the energy loss of the primary. Two groups are identified in the cascade of slow electrons, corresponding to different stages in the energy dissipation process. The characteristic lengths for attenuation due to collective excitations and momentum relaxation are quantified for both groups and are found to be distinctly different: λ_{1}=(12±2) Å and λ_{2}=(62±11) Å.
View Article and Find Full Text PDFThe detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering is the inelastic mean free path (IMFP) of electrons both in bulk materials and in thin films, including 2D crystals. The amount of IMFP data available is still not sufficient, especially for very slow electrons and for 2D crystals.
View Article and Find Full Text PDFTwo-particle spectroscopy with correlated electron pairs is used to establish the causal link between the secondary electron spectrum, the (π+σ) plasmon peak, and the unoccupied band structure of highly oriented pyrolytic graphite. The plasmon spectrum is resolved with respect to the involved interband transitions and clearly exhibits final state effects, in particular due to the energy gap between the interlayer resonances along the ΓA direction. The corresponding final state effects can also be identified in the secondary electron spectrum.
View Article and Find Full Text PDFSupersurface electron scattering, i.e., electron energy losses and associated deflections in vacuum above the surface of a medium, is shown to contribute significantly to electron spectra.
View Article and Find Full Text PDFThe collision statistics of the energy dissipation of Auger and photoelectrons emitted from an amorphized Si(100) surface is studied by measuring the Si 2p photoelectron line as well as the first plasmon loss peak in coincidence with the Si-LVV Auger transition and the associated first plasmon loss. The Si 2p plasmon intensity decreases when measured in coincidence with the Si-LVV peak. If measured in coincidence with the Si-LVV plasmon the decrease is significantly smaller.
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