Measurement of modal birefringence in optical waveguides based on the Mach-Zehnder interferometer.

A method for measuring the birefringence in planar waveguide circuits is theoretically proposed and validated. The method is based on the Mach-Zehnder interference and by measuring the spectral shift due to orthogonal polarization states. The birefringence of a silica waveguide is measured to be 2.