Publications by authors named "William R McGehee"

Atomic beams are a longstanding technology for atom-based sensors and clocks with widespread use in commercial frequency standards. Here, we report the demonstration of a chip-scale microwave atomic beam clock using coherent population trapping (CPT) interrogation in a passively pumped atomic beam device. The beam device consists of a hermetically sealed vacuum cell fabricated from an anodically bonded stack of glass and Si wafers in which lithographically defined capillaries produce Rb atomic beams and passive pumps maintain the vacuum environment.

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Electrochemical processes that govern the performance of lithium ion batteries involve numerous parallel reactions and interfacial phenomena that complicate the microscopic understanding of these systems. To study the behavior of ion transport and reaction in these applications, we report the use of a focused ion beam of Li to locally insert controlled quantities of lithium with high spatial resolution into electrochemically relevant materials . To benchmark the technique, we present results on direct-write lithiation of 35 nm thick crystalline silicon membranes using a 2 keV beam of Li at doses up to 10 cm (10 nm).

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High-resolution imaging of optical resonator modes is a key step in the development and characterization of nanophotonic devices. Many sub-wavelength mode-imaging techniques have been developed using optical and electron beam excitation-each with its own limitations in spectral and spatial resolution. Here, we report a 2D imaging technique using a pulsed, low-energy focused ion beam of Li to probe the near-surface fields inside photonic resonators.

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The development of Li focused ion beams (Li-FIB) enables controlled Li ion insertion into materials with nanoscale resolution. We take the first step toward establishing the relevance of the Li-FIB for studies of ion dynamics in electrochemically active materials by comparing FIB lithiation with conventional electrochemical lithiation of isolated -Sn microspheres. Samples are characterized by cross-sectioning with Ga FIB and imaging via electron microscopy.

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